SPC584B60E1
32-bit Automotive Power Architecture MCUThe SPC584B60E1 is a 32-bit automotive power architecture mcu from STMicroelectronics. View the full SPC584B60E1 datasheet below including key specifications, electrical characteristics, absolute maximum ratings.
Official SPC584B60E1 datasheet (PDF) — the source this page was extracted from.
SPC584B60E1 Key Specifications
| Parameter | Value |
|---|---|
| ADC | 2x 12-bit fast SAR, 1x 12-bit supervisor SAR, 1x 10-bit SAR with STDBY |
| DMA | 64 eDMA channels |
| I2C | 1 |
| Core | e200z420 32-bit Power Architecture, up to 120 MHz |
| SRAM | 128 KB general-purpose + 64 KB core local data RAM |
| Flash | 2112 KB (2048 KB code + 64 KB data) |
| Safety | ASIL-B (ISO 26262) |
| Ethernet | 1x 10/100 Mbps (IEEE 802.3-2008) |
| HSM Flash | 176 KB (144 KB code + 32 KB data) |
| Timed I/O | eMIOS up to 64 channels, 16-bit counter |
| Qualification | AEC-Q100 |
| CAN Interfaces | 8 MCAN (ISO CAN-FD) |
| LIN Interfaces | 14 LINFlexD |
| SPI Interfaces | 7 DSPI |
| Package Dimensions | 10 x 10 x 1.0 mm |
| External Power Supplies | 5 V, 3.3 V |
| Junction Temperature Range | -40 °C to 150 °C |
SPC584B60E1 Overview
Part: SPC584Bx (SPC584B60/B64/B70) — STMicroelectronics
Type: 32-bit Power Architecture Automotive Microcontroller (ASIL-B)
Description: 32-bit Power Architecture e200z420 MCU running at up to 120 MHz with 2112 KB flash (2048 KB code + 64 KB data), 128 KB SRAM, 8 MCAN (CAN-FD) interfaces and Ethernet, AEC-Q100 qualified.
Operating Conditions:
- Supply voltage: 5 V and 3.3 V external supplies (integrated linear voltage regulator for the core); detailed ranges are in Section 4.3
- Junction temperature range: -40 to 150 °C
- Core frequency: up to 120 MHz
Absolute Maximum Ratings:
- Core voltage (VDD_LV): -0.3 to 1.4 V
- I/O supply voltage (VDD_HV_IO_MAIN, VDD_HV_IO_ETH, VDD_HV_OSC, VDD_HV_FLA): -0.3 to 6.0 V
- ADC supply voltage (VDD_HV_ADV) and SAR ADC reference voltage (VDD_HV_ADR_S): -0.3 to 6.0 V
- I/O input voltage (VIN): -0.3 to 6.0 V
- Maximum DC injection current per analog/digital pad: ±5 mA
- Storage temperature (non-operating, TSTG): -55 to 125 °C
- Maximum non-operating temperature during passive lifetime (TPAS): 150 °C
- Maximum solder temperature (Pb-free): 260 °C
Key Specs:
- CPU: e200z420, 32-bit, dual issue, VLE, single-precision FPU, up to 120 MHz
- Memory: 2048 KB code flash + 64 KB data flash, 176 KB HSM flash, 128 KB SRAM + 64 KB local data RAM
- Cache: 8 KB instruction + 4 KB data
- ADC: 2 fast 12-bit SAR, 1 supervisor 12-bit SAR, 1 10-bit SAR with standby support
- Timers: eMIOS with up to 64 channels (16-bit counters), BCTU with 64 channels
- Communication: 8 MCAN (ISO CAN-FD), 14 LINFlexD, 7 DSPI, 1 I2C, 10/100 Mbps Ethernet
- Junction temperature: -40 to 150 °C
- Moisture sensitivity level: MSL 3
Features:
- AEC-Q100 qualified
- ASIL-B safety concept per ISO 26262, with FCCU and MEMU
- Hardware security module (HSM) with cryptographic co-processor
- 64-channel eDMA (32 channels per the features table), crossbar switch with end-to-end ECC
- Dual PLLs with frequency modulation
- Low-power modes: HALT, STOP, STANDBY, smart standby with Smart Wake-up Unit
- Nexus Development Interface (IEEE-ISTO 5001) and JTAG (IEEE 1149.1/1149.7)
- Boot Assist Flash for serial bootload via CAN or LIN/UART
- On-chip temperature sensor and CRC unit
Applications:
- Automotive body control and ASIL-B safety applications
- Automotive networking and gateway (CAN-FD, Ethernet, LIN)
Package:
- eTQFP64 (10 x 10 x 1.0 mm)
- eTQFP100 (14 x 14 x 1.0 mm)
- eTQFP144 (20 x 20 x 1.0 mm)
- eLQFP176 (24 x 24 x 1.4 mm)
SPC584B60E1 Features
-
AEC-Q100 qualified
-
High performance e200z420
-
-32-bit Power Architecture technology CPU
-
-Core frequency as high as 120 MHz
-
-Variable Length Encoding (VLE)
-
2112 KB (2048 KB code flash + 64 KB data flash) on-chip flash memory: supports read during program and erase operations, and multiple blocks allowing EEPROM emulation
-
176 KB HSM dedicated flash memory (144 KB code + 32 KB data)
-
128 KB on-chip general-purpose SRAM (in addition to 64 KB core local data RAM
-
Crossbar switch architecture for concurrent access to peripherals, Flash, or RAM from multiple bus masters with end-to-end ECC
-
Multi-channel direct memory access controller (eDMA) with 64 channels
-
1 interrupt controller (INTC)
-
Comprehensive new generation ASIL-B safety concept
-
-ASIL-B of ISO 26262
-
-FCCU for collection and reaction to failure notifications
-
Boot Assist Flash (BAF) supports factory programming using a serial bootload through the asynchronous CAN or LIN/UART
-
Junction temperature range -40 °C to 150 °C
Table 1. Device summary
| Package | Part number - 1 MB | Part number - 1.5 MB | Part number - 2 MB |
|---|---|---|---|
| eTQFP64 | SPC584B60E1 | SPC584B64E1 | SPC584B70E1 |
| eTQFP100 | SPC584B60E3 | SPC584B64E3 | SPC584B70E3 |
| eTQFP144 | SPC584B60E5 | SPC584B64E5 | SPC584B70E5 |
| eLQFP176 | SPC584B60E7 | SPC584B64E7 | SPC584B70E7 |
Table 1. Device summary
SPC584B60E1 Electrical Characteristics
The following table provides input DC electrical characteristics, as described in Figure 3 .
Figure 3. I/O input electrical characteristics
SPC584B60E1 Absolute Maximum Ratings
Table 4 describes the maximum ratings for the device. Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Stress beyond the listed maxima, even momentarily, may affect device reliability or cause permanent damage to the device.
Table 4. Absolute maximum ratings
| Symbol | C | Parameter | Conditions | Value - Min | Value - Typ | Value - Max | Unit | |
|---|---|---|---|---|---|---|---|---|
| V DD_LV | SR | D | Core voltage operating life range (1) | - | -0.3 | - | 1.4 | V |
| V DD_HV_IO_MAIN VDD_HV_IO_ETH V DD_HV_OSC V DD_HV_FLA | SR | D | I/O supply voltage (2) | - | -0.3 | - | 6.0 | V |
| V SS_HV_ADV | SR | D | ADC ground voltage | Reference to digital ground | -0.3 | - | 0.3 | V |
| V DD_HV_ADV | SR | D | ADC Supply voltage (2) | Reference to V SS_HV_ADV | -0.3 | - | 6.0 | V |
| V SS_HV_ADR_S | SR | D | SAR ADC ground reference | - | -0.3 | - | 0.3 | V |
| V DD_HV_ADR_S | SR | D | SAR ADC voltage reference (2) | Reference to V SS_HV_ADR_S | -0.3 | - | 6.0 | V |
| V SS -V SS_HV_ADR_S | SR | D | V SS_HV_ADR_S differential voltage | - | -0.3 | - | 0.3 | V |
| V SS -V SS_HV_ADV | SR | D | V SS_HV_ADV differential voltage | - | -0.3 | - | 0.3 | V |
| V IN | SR | D | I/O input voltage range (2)(3) (4) | - | -0.3 | - | 6.0 | V |
| SR | D | I/O input voltage range (2)(3) (4) | Relative to V ss | -0.3 | - | - | V | |
| SR | D | I/O input voltage range (2)(3) (4) | Relative to V DD_HV_IO and V DD_HV_ADV | - | - | 0.3 | V | |
| T TRIN | SR | D | Digital Input pad transition time (5) | - | - | - | 1 | ms |
| I INJ | SR | T | Maximum DC injection current for each analog/digital PAD (6) | - | -5 | - | 5 | mA |
Table 4. Absolute maximum ratings
16
Table 4. Absolute maximum ratings (continued)
| Symbol | C | Parameter | Conditions | Value - Min | Value - Typ | Value - Max | Unit | |
|---|---|---|---|---|---|---|---|---|
| T STG | SR | T | Maximum non- operating Storage temperature range | - | -55 | - | 125 | °C |
| T PAS | SR | C | Maximum nonoperating temperature during passive lifetime | - | -55 | - | 150 (7) | °C |
| T STORAGE | SR | - | Maximum storage time, assembled part programmed in ECU | Nosupply; storage temperature in range -40 °C to 60 °C | - | - | 20 | years |
| T SDR | SR | T | Maximumsolder temperature Pb- free packaged (8) | - | - | - | 260 | °C |
| MSL | SR | T | Moisture sensitivity level (9) | - | - | - | 3 | - |
| T XRAY dose | SR | T | Maximum cumulated XRAY dose | Typical range for X-rays source during inspection:80 ÷ 130 KV; 20 ÷ 50 A | - | - | 1 | grey |
- VDD_LV : allowed 1.335 V - 1.400 V for 60 seconds cumulative time at the given temperature profile. Remaining time allowed 1.260 V - 1.335 V for 10 hours cumulative time at the given temperature profile. Remaining time as defined in Section 4.3: Operating conditions .
- VDD_HV : allowed 5.5 V - 6.0 V for 60 seconds cumulative time at the given temperature profile, for 10 hours cumulative time with the device in reset at the given temperature profile. Remaining time as defined in Section 4.3: Operating conditions .
- The maximum input voltage on an I/O pin tracks with the associated I/O supply maximum. For the injection current condition on a pin, the voltage will be equal to the supply plus the voltage drop across the internal ESD diode from I/O pin to supply. The diode voltage varies greatly across process and temperature, but a value of 0.3 V can be used for nominal calculations.
- Relative value can be exceeded if design measures are taken to ensure injection current limitation (parameter IINJ).
- This limitation applies to pads with digital input buffer enabled. If the digital input buffer is disabled, there are no maximum limits to the transition time.
- The limits for the sum of all normal and injected currents on all pads within the same supply segment can be found in Section 4.8.3: I/O pad current specifications .
- 175 °C are allowed for limited time. Mission profile with passive lifetime temperature >150 °C have to be evaluated by ST to confirm that are granted by product qualification.
- Solder profile per IPC/JEDEC J-STD-020D.
- Moisture sensitivity per JDEC test method A112.
SPC584B60E1 Thermal Information
The following tables describe the thermal characteristics of the device. The parameters in this chapter have been evaluated by considering the device consumption configuration reported in the Section 4.7: Device consumption .
SPC584B60E1 Package Information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages, depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: www.st.com . ECOPACK is an ST trademark.
The following table lists the case numbers for SPC584Bx.
Table 60. Package case numbers
| Package type | Device type |
|---|---|
| eTQFP64 | Production |
| eTQFP100 | Production |
| eTQFP144 | Production |
| eLQFP176 | Production |
Variants on the same datasheet
These parts have exact links to the same datasheet. They are candidates to compare, not verified drop-in replacements; check package, pinout and electrical limits.
| Part Number | Manufacturer | Package |
|---|---|---|
| SPC584B60E3 | STMicroelectronics | eTQFP-100 |
| SPC584B64E1 | STMicroelectronics | eTQFP-64 |
| SPC584B64E3 | STMicroelectronics | eTQFP-100 |
| SPC584B70E1 | STMicroelectronics | eTQFP-64 10x10mm |
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