MCP2551T
High-Speed CAN Transceiver
High-Speed CAN TransceiverThe MCP2551T is a high-speed can transceiver from Microchip Technology. High-Speed CAN Transceiver. View the full MCP2551T datasheet below including electrical characteristics, absolute maximum ratings.
Manufacturer
Microchip Technology
Category
High-Speed CAN Transceiver
Overview
Part: MCP2551 High-Speed CAN Transceiver (Microchip)
Type: High-Speed CAN Transceiver
Description: The MCP2551 is a fault-tolerant high-speed CAN transceiver that provides differential transmit and receive capability for CAN protocol controllers, supporting up to 1 Mb/s operation and compatible with ISO-11898 standard physical layer requirements.
Operating Conditions:
- Supply voltage: 4.5–5.5 V
- Operating temperature: -40 to +125 °C
- Max data rate: 1 Mb/s
- Max nodes: 112
Absolute Maximum Ratings:
- Max supply voltage: 7.0 V
- Max DC voltage at CANH, CANL: -42 V to +42 V
- Max junction temperature: +150 °C
Key Specs:
- Dominant differential input voltage: 0.9–5.0 V
- Differential input hysteresis: 100–200 mV
- CANH, CANL Common-mode input resistance: 5–50 kΩ
- Differential input resistance: 20–100 kΩ
- TXD High-level input voltage: 2.0 V (min)
- RXD Low-level output voltage: 0.8 V (max)
- Shutdown junction temperature: 155–180 °C
- ESD protection on CANH and CANL pins: 6 kV
Features:
- Supports 1 Mb/s operation
- Implements ISO-11898 standard physical layer requirements
- Externally-controlled slope for reduced RFI emissions
- Power-on Reset and voltage brown-out protection
- Automatic thermal shutdown protection
- Up to 112 nodes can be connected
Applications:
Package:
- 8-Lead Plastic Dual In-Line (P) - 300 mil Body [PDIP]
Features
- Supports 1 Mb/s operation
- Implements ISO-11898 standard physical layer requirements
- · Suitable for 12V and 24V systems
- Externally-controlled slope for reduced RFI emissions
- Detection of ground fault (permanent Dominant) on TXD input
- Power-on Reset and voltage brown-out protection
- An unpowered node or brown-out event will not disturb the CAN bus
- · Low current standby operation
- Protection against damage due to short-circuit conditions (positive or negative battery voltage)
- · Protection against high-voltage transients
- Automatic thermal shutdown protection
- Up to 112 nodes can be connected
- High-noise immunity due to differential bus implementation
- Temperature ranges:
- Industrial (I): -40°C to +85°C
- Extended (E): -40°C to +125°C
Pin Configuration
The 8-pin pinout is listed in Table 1-3.
TABLE 1-3: MCP2551 PINOUT
| Pin Number | Pin Name | Pin Function |
|---|---|---|
| 1 | TXD | Transmit Data Input |
| 2 | Vss | Ground |
| 3 | VDD | Supply Voltage |
| 4 | RXD | Receive Data Output |
| 5 | VREF | Reference Output Voltage |
| 6 | CANL | CAN Low-Level Voltage I/O |
| 7 | CANH | CAN High-Level Voltage I/O |
| 8 | Rs | Slope-Control Input |
1.7.1 TRANSMITTER DATA INPUT (TXD)
TXD is a TTL-compatible input pin. The data on this pin is driven out on the CANH and CANL differential output pins. It is usually connected to the transmitter data output of the CAN controller device. When TXD is Low, CANH and CANL are in the Dominant state. When TXD is High, CANH and CANL are in the Recessive state, provided that another CAN node is not driving the CAN bus with a Dominant state. TXD has an internal pull-up resistor (nominal 25 kΩ to VDD).
1.7.2 GROUND SUPPLY (VSS)
Ground supply pin.
Electrical Characteristics
2.1 Terms and Definitions
A number of terms are defined in ISO-11898 that are used to describe the electrical characteristics of a CAN transceiver device. These terms and definitions are summarized in this section.
2.1.1 BUS VOLTAGE
VCANL and VCANH denote the voltages of the bus line wires CANL and CANH relative to ground of each individual CAN node.
2.1.2 COMMON MODE BUS VOLTAGE RANGE
Boundary voltage levels of VCANL and VCANH with respect to ground, for which proper operation will occur, if up to the maximum number of CAN nodes are connected to the bus.
2.1.3 DIFFERENTIAL INTERNAL CAPACITANCE, CDIFF (OF A CAN NODE)
Capacitance seen between CANL and CANH during the Recessive state when the CAN node is disconnected from the bus (see Figure 2-1).
2.1.4 DIFFERENTIAL INTERNAL RESISTANCE, RDIFF (OF A CAN NODE)
Resistance seen between CANL and CANH during the Recessive state when the CAN node is disconnected from the bus (see Figure 2-1).
2.1.5 DIFFERENTIAL VOLTAGE, VDIFF (OF CAN BUS)
Differential voltage of the two-wire CAN bus, value VDIFF = VCANH - VCANL.
2.1.6 INTERNAL CAPACITANCE, CIN (OF A CAN NODE)
Capacitance seen between CANL (or CANH) and ground during the Recessive state when the CAN node is disconnected from the bus (see Figure 2-1).
2.1.7 INTERNAL RESISTANCE, RIN (OF A CAN NODE)
Resistance seen between CANL (or CANH) and ground during the Recessive state when the CAN node is disconnected from the bus (see Figure 2-1).
FIGURE 2-1: PHYSICAL LAYER DEFINITIONS
Absolute Maximum Ratings†
-
DC Voltage at TXD, RXD, VREF and VS0.3V to VDD + 0.3V
-
DC Voltage at CANH, CANL (Note 1)42V to +42V
-
Transient Voltage on Pins 6 and 7 (Note 2)250V to +250V
-
Storage temperature55°C to +150°C
-
Operating ambient temperature40°C to +125°C
-
Virtual Junction Temperature, TVJ (Note 3)40°C to +150°C
-
Soldering temperature of leads (10 seconds)+300°C
-
ESD protection on CANH and CANL pins (Note 4)6 kV
-
ESD protection on all other pins (Note 4)4 kV
-
Note 1: Short-circuit applied when TXD is High and Low.
- 2: In accordance with ISO-7637.
- 3: In accordance with IEC 60747-1.
- 4: Classification A: Human Body Model.
† NOTICE: Stresses above those listed under "Maximum ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
2.2 DC Characteristics
| Rating/Characteristic | Value |
|---|---|
| VDD | 7.0V |
| DC Voltage at TXD, RXD, VREF and Vs | -0.3V to VDD + 0.3V |
| DC Voltage at CANH, CANL (Note 1) | -42V to +42V |
| Transient Voltage on Pins 6 and 7 (Note 2) | -250V to +250V |
| Storage temperature | -55°C to +150°C |
| Operating ambient temperature | -40°C to +125°C |
| Virtual Junction Temperature | |
| Note 1: This parameter is periodically sampled and not 100% tested. |
2: ITXD = IRXD = IVREF = 0 mA; 0V < VCANL < VDD; 0V < VCANH < VDD; VRS = VDD
3: This is valid for the receiver in all modes; High-speed, Slope-control and Standby.
Absolute Maximum Ratings
-
DC Voltage at TXD, RXD, VREF and VS0.3V to VDD + 0.3V
-
DC Voltage at CANH, CANL (Note 1)42V to +42V
-
Transient Voltage on Pins 6 and 7 (Note 2)250V to +250V
-
Storage temperature55°C to +150°C
-
Operating ambient temperature40°C to +125°C
-
Virtual Junction Temperature, TVJ (Note 3)40°C to +150°C
-
Soldering temperature of leads (10 seconds)+300°C
-
ESD protection on CANH and CANL pins (Note 4)6 kV
-
ESD protection on all other pins (Note 4)4 kV
-
Note 1: Short-circuit applied when TXD is High and Low.
- 2: In accordance with ISO-7637.
- 3: In accordance with IEC 60747-1.
- 4: Classification A: Human Body Model.
† NOTICE: Stresses above those listed under "Maximum ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
Related Variants
The following components are covered by the same datasheet.
| Part Number | Manufacturer | Package |
|---|---|---|
| MCP2551 | Microchip Technology | PDIP-8 |
| MCP2551-E/P | Microchip Technology | PDIP-8 (300 mil) |
| MCP2551-E/SN | Microchip Technology | SOIC-8 (Narrow, 3.90mm) |
| MCP2551-I/P | Microchip Technology | PDIP-8 (300 mil) |
| MCP2551-I/SN | Microchip Technology | SOIC-8 (Narrow, 3.90mm) |
| MCP2551T-E/SN | Microchip Technology | SOIC-8 (Narrow, 3.90mm) |
| MCP2551T-I/SN | Microchip Technology | SOIC-8 (Narrow, 3.90mm) |
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