FM25V02A-G
Serial F-RAM Nonvolatile MemoryThe FM25V02A-G is a serial f-ram nonvolatile memory from Infineon Technologies. View the full FM25V02A-G datasheet below including key specifications, absolute maximum ratings.
Official FM25V02A-G datasheet (PDF) — the source this page was extracted from.
FM25V02A-G Key Specifications
| Parameter | Value |
|---|---|
| Endurance | 10^14 read/write cycles |
| Interface | SPI (mode 0 and mode 3) |
| Memory Size | 256-Kbit (32K x 8) |
| Active Current | 2.5 mA at 40 MHz |
| Data Retention | 151 years |
| Supply Voltage | 2.0V to 3.6V |
| Standby Current | 150 µA |
| Write Protection | Hardware (WP pin) and software block protection (1/4, 1/2, entire array) |
| Sleep Mode Current | 8 µA |
| Max Clock Frequency | 40 MHz |
| Operating Temperature | -40°C to +85°C |
FM25V02A-G Overview
Part: FM25V02A — Cypress Semiconductor / Infineon Technologies
Type: Serial (SPI) F-RAM Nonvolatile Memory
Description: 256-Kbit (32K × 8) nonvolatile serial F-RAM operating from 2.0 V to 3.6 V up to 40 MHz with virtually unlimited endurance and zero write delays.
Operating Conditions:
- Supply voltage: 2.0 V to 3.6 V
- Operating temperature: -40 °C to +85 °C
- Clock frequency: 0 to 40 MHz
Absolute Maximum Ratings:
- Max supply voltage: -1.0 V to +4.5 V (relative to VSS)
- Max junction/storage temperature: -65 °C to +125 °C (storage)
Key Specs:
- Density: 256 Kbit (32,768 × 8 bits)
- Interface: SPI (Mode 0 and Mode 3) up to 40 MHz
- Read/write endurance: 100 trillion (10^14) cycles
- Data retention: 151 years
- Active current: 2.5 mA (at 40 MHz)
- Standby current: 150 μA
- Sleep mode current: 8 μA
Features:
- High-endurance ferroelectric random access memory (F-RAM)
- NoDelay writes at bus speed without data polling
- Hardware and software write protection schemes
- Low power consumption with sleep mode
- Read-only Device ID (Manufacturer ID and Product ID)
- Direct drop-in hardware replacement for serial EEPROM and flash
- RoHS compliant
Applications:
- Data logging
- Demanding industrial controls
- Frequent or rapid nonvolatile write storage
Package:
- 8-pin SOIC
- 8-pin DFN
FM25V02A-G Features
- ■ 256-Kbit ferroelectric random access memory (F-RAM) logically organized as 32K × 8
- ❐ High-endurance 100 trillion (10 14 ) read/writes
- ❐ 151-year data retention (See Data Retention and Endurance on page 14)
- ❐ NoDelay™ writes
- ❐ Advanced high-reliability ferroelectric process
- ■ Very fast serial peripheral interface (SPI)
- ❐ Up to 40-MHz frequency
- ❐ Direct hardware replacement for serial flash and EEPROM
- ❐ Supports SPI mode 0 (0, 0) and mode 3 (1, 1)
- ■ Sophisticated write-protection scheme ❐ Hardware protection using the Write Protect (WP) pin ❐ Software protection using Write Disable instruction ❐ Software block protection for 1/4, 1/2, or entire array
- ■ Device ID ❐ Manufacturer ID and Product ID
- ■ Low power consumption ❐ 2.5-mA active current at 40 MHz ❐ 150- A standby current ❐ 8- A sleep mode current
- ■ Low-voltage operation: V DD = 2.0 V to 3.6 V
- ■ Industrial temperature: -40 C to +85 C
- ■
- Packages ❐ 8-pin small outline integrated circuit (SOIC) package ❐ 8-pin dual flat no-leads (DFN) package
- ■ Restriction of hazardous substances (RoHS) compliant
FM25V02A-G Absolute Maximum Ratings
- Storage temperature ............................... -65 °C to + 125 °C
- Maximum accumulated storage time At 125 °C ambient temperature ................................. 1000 h At 85 °C ambient temperature ................................ 10 Years
- Ambient temperature with power applied ................................... -55 °C to +125 °C
- Supply voltage on V DD relative to V SS ........-1.0 V to + 4.5 V
- Input voltage ........... -1.0 V to +4.5 V and V IN < V DD + 1.0 V
- DC voltage applied to outputs in HI-Z state ........................................-0.5 V to V DD + 0.5 V
- Transient voltage (< 20 ns) on any pin to ground potential ............-2.0 V to V DD + 2.0 V
FM25V02A-G Thermal Information
| Parameter [5] | Description | Test Conditions | 8-pin SOIC | 8-pin DFN | Unit |
|---|---|---|---|---|---|
| JA | Thermal resistance (junction to ambient) | Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. | 146 | 31 | C/W |
| JC | Thermal resistance (junction to case) | Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. | 48 | 35 | C/W |
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- ZD25WQ16CTIGT – Zetta, Serial Multi I/O NOR Flash
- AT25SL128A-MHE-T – Renesas Electronics, 128-Mbit SPI Serial NOR Flash
- W25Q32JVSSIQ – Winbond
- 23A1024 – Microchip Technology, Serial SRAM
- 23LC1024 – Microchip Technology, Serial SRAM
All Memory ICs datasheetsAll Infineon Technologies datasheets (140)
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