DAC8562/883

Part: DAC8562 — Analog Devices, Inc.

Type: 12-Bit Voltage Output Digital-to-Analog Converter (DAC)

Description: A complete, parallel input, 12-bit, voltage output DAC designed to operate from a single +5 volt supply, offering 1 mV/bit resolution with a 4.095 V full scale output and -5 mA drive capability.

Operating Conditions:

• Supply voltage: +4.75 V to +5.25 V
• Operating temperature: -40 °C to +85 °C
• Full-scale output voltage: 4.095 V

Absolute Maximum Ratings:

• Max supply voltage: +10 V (VDD to DGND and AGND)
• Max continuous current: 50 mA (I OUT Short Circuit to GND)
• Max junction/storage temperature: +150 °C

Key Specs:

• Resolution: 12 Bits
• Relative Accuracy (INL, E Grade): -1/2 to +1/2 LSB
• Differential Nonlinearity (DNL): -1 to +1 LSB
• Full-Scale Voltage (E Grade): 4.087 V to 4.103 V (Typ 4.095 V)
• Output Current: -5 mA (Data = 800 H)
• Voltage Output Settling Time: 16 μs (Typ, To -1 LSB of Final Value)
• Positive Supply Current: 3 mA (Typ, V IH = 2.4 V, V IL = 0.8 V)
• Power Dissipation: 15 mW (Typ, V IH = 2.4 V, V IL = 0.8 V)

Features:

• Complete 12-Bit DAC, no external components
• Single +5 Volt Operation
• 1 mV/Bit with 4.095 V Full Scale
• True Voltage Output, -5 mA Drive
• Very Low Power -3 mW (Typ, V IL = 0 V, V DD = +5 V)
• Parallel digital interface
• Asynchronous CLR input

Applications:

• Digitally Controlled Calibration
• Servo Controls
• Process Control Equipment
• PC Peripherals

Package:

• 20-Pin Plastic DIP (N-20)
• 20-Lead SOIC (R-20)

Parameter	Symbol	Condition	Min	Typ	Max	Units
STATIC PERFORMANCE
Resolution	N	Note 2	12			Bits
Relative Accuracy	INL	E Grade	-1/2	- 1/4	+1/2	LSB
		F Grade	-1	- 3/4	+1	LSB
Differential Nonlinearity	DNL	No Missing Codes	-1	- 3/4	+1	LSB
Zero-Scale Error	V ZSE	Data = 000 H		+1/2	+3	LSB
Full-Scale Voltage	V FS	Data - FFF H 3
		E Grade	4.087	4.095	4.103	V
		F Grade	4.079	4.095	4.111	V
Full-Scale Tempco	TCV FS	Notes 3, 4		- 16		ppm/ C
ANALOG OUTPUT
Output Current	I OUT	Data = 800	- 5	- 7		mA
Load Regulation at Half Scale	LD REG	H R L = 402 W to ¥ , Data = 800		1	3	LSB
Capacitive Load	C L	No Oscillation 4		500		pF
REFERENCE OUTPUT
Output Voltage	V REF		2.484	2.500	2.516	V
Output Source Current	I REF	Note 5	5	7		mA
Line Rejection	LN REJ				0.08	%/V
Load Regulation	LD REG	I REF = 0 to 5 mA			0.1	%/mA
LOGIC INPUTS
Logic Input Low Voltage	V IL				0.8	V
Logic Input High Voltage	V IH		2.4			V
Input Leakage Current	I IL				10	m A
Input Capacitance	C IL	Note 4			10	pF
INTERFACE TIMING SPECIFICATIONS 1, 4
Chip Enable Pulse Width	t CEW		30			ns
Data Setup	t DS		30			ns
Data Hold	t DH		10			ns
Clear Pulse Width	t CLRW		20			ns
AC CHARACTERISTICS 4
Voltage Output Settling Time 6	t S	To - 1 LSB of Final Value		16		m s
Digital Feedthrough				35		nV sec
SUPPLY CHARACTERISTICS
Positive Supply Current	I DD	V IH = 2.4 V, V IL = 0.8 V		3	6	mA
Power Dissipation	P DISS	V IL = 0 V, V DD = +5 V V IH = 2.4 V, V IL = 0.8 V V = 0 V, V = +5V		0.6 15	1 30	mA mW
Power Supply Sensitivity	PSS	IL DD D V DD = - 5%		3 0.002	5 0.004	mW %/%

V DD to DGND and AGND . . . . . . . . . . .	. . . . . -0.3 V, +10 V
Logic Inputs to DGND . . . . . . . . . . . . . .	.-0.3 V, V DD + 0.3 V
V OUT to AGND . . . . . . . . . . . . . . . . . . . .	.-0.3 V, V DD + 0.3 V
V REFOUT to AGND . . . . . . . . . . . . . . . . .	.-0.3 V, V DD + 0.3 V
AGND to DGND . . . . . . . . . . . . . . . . . .	. . . . . . . -0.3 V, V DD
I OUT Short Circuit to GND . . . . . . . . . . .	. . . . . . . . . . . 50 mA
Package Power Dissipation . . . . . . . . . . .	. . .(T J max - T A )/ u JA
Thermal Resistance u JA 20-Pin Plastic DIP Package (P) . . . . . .	. . . . . . . . . . 74 C/W
20-Lead SOIC Package (S) . . . . . . . . .	. . . . . . . . . . 89 C/W
Maximum Junction Temperature (T J max)	. . . . . . . . . . 150 C
Operating Temperature Range . . . . . . . . .	. . . .-40 C to +85 C
Storage Temperature Range . . . . . . . . . .	. . . -65 C to +150 C
Lead Temperature (Soldering, 10 secs) . .	. . . . . . . . . . +300 C

*Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.