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TUSB8041RGCR

USB 3.0 Hub

The TUSB8041RGCR is a usb 3.0 hub from Texas Instruments. View the full TUSB8041RGCR datasheet below including key specifications, electrical characteristics, absolute maximum ratings.

Manufacturer

Texas Instruments

Category

USB 3.0 Hub

Package

VQFN-64 (RGC)

Key Specifications

ParameterValue
USB Ports4 (1 upstream, 4 downstream)
USB StandardUSB 3.0 (backward compatible with USB 2.0, high-speed, full-speed, low-speed)
Package Dimensions9.00 mm x 9.00 mm
Clock Input Frequency24 MHz
Configuration InterfacesOTP ROM, Serial EEPROM, I2C/SMBus Slave
Operating Temperature Range (Commercial)0°C to 70°C
Operating Temperature Range (Industrial)-40°C to 85°C

Overview

Part: TUSB8041

Type: Four-Port USB 3.0 Hub

Description: The TUSB8041 is a four-port USB 3.0 hub that provides simultaneous SuperSpeed USB and high-speed/full-speed connections on the upstream port, and SuperSpeed USB, high-speed, full-speed, or low-speed connections on the downstream ports, supporting per port or ganged power switching, over-current protection, and battery charging applications.

Operating Conditions:

  • Operating temperature: 0°C to 70°C (commercial), -40°C to 85°C (industrial)
  • Clock input: 24-MHz Crystal or Oscillator

Features:

  • Four Port USB 3.0 Hub
  • USB 2.0 Hub Features: Multi Transaction Translator (MTT) Hub with four Transaction Translators and four Asynchronous Endpoint Buffers Per Transaction Translator
  • Supports Battery Charging: CDP Mode, DCP Mode (complies with Chinese Telecommunications Industry Standard YD/T 1591-2009), D+/D- Divider Mode
  • Supports Operation as a USB 3.0 or USB 2.0 Compound Device
  • Per Port or Ganged Power Switching and OverCurrent Notification Inputs
  • OTP ROM, Serial EEPROM or I2C/SMBus Slave Interface for Custom Configurations (VID, PID, Port Customizations, Manufacturer and Product Strings, Serial Number)
  • Provides 128-Bit Universally Unique Identifier (UUID)
  • Supports On-Board and In-System OTP/EEPROM Programming Via the USB 2.0 Upstream Port
  • Single Clock Input, 24-MHz Crystal or Oscillator
  • No Special Driver Requirements

Applications:

  • Computer Systems
  • Docking Stations
  • Monitors
  • Set-Top Boxes

Package:

  • VQFN (64) - 9.00 mm × 9.00 mm

Features

  • 1 · Four Port USB 3.0 Hub
  • USB 2.0 Hub Features
  • -Multi Transaction Translator (MTT) Hub: Four Transaction Translators
  • -Four Asynchronous Endpoint Buffers Per Transaction Translator
  • Supports Battery Charging
  • -CDP Mode (Upstream Port Connected)
  • -DCP Mode (Upstream Port Unconnected)
  • -DCP Mode Complies with Chinese Telecommunications Industry Standard YD/T 1591-2009
  • -D+/D- Divider Mode
  • Supports Operation as a USB 3.0 or USB 2.0 Compound Device
  • Per Port or Ganged Power Switching and OverCurrent Notification Inputs
  • OTP ROM, Serial EEPROM or I 2 C/SMBus Slave Interface for Custom Configurations:
  • -VID and PID
  • -Port Customizations
  • -Manufacturer and Product Strings (not by OTP ROM)
  • -Serial Number (not by OTP ROM)
  • Application Feature Selection Using Pin Selection or EEPROM/ or I 2 C/SMBus Slave Interface
  • Provides 128-Bit Universally Unique Identifier (UUID)
  • Supports On-Board and In-System OTP/EEPROM Programming Via the USB 2.0 Upstream Port

Applications

  • Computer Systems
  • Docking Stations
  • Monitors
  • Set-Top Boxes

Pin Configuration

Electrical Characteristics

over operating free-air temperature range (unless otherwise noted)

PARAMETERPARAMETEROPERATIONTEST CONDITIONSMINMAXUNIT
V IHHigh-level input voltage (1)VDD332VDD33V
V ILLow-level input voltage (1)VDD33JTAG pins only0 00.8 0.55V
V IInput voltage0VDD33V
V OOutput voltage (2)0VDD33V
t tInput transition time (t rise and t fall )025ns
V hysInput hysteresis (3)0.13 x VDD33V
V OHHigh-level output voltageVDD33I OH = -4 mA2.4V
V OLLow-level output voltageVDD33I OL = 4 mA0.4V
I OZHigh-impedance, output current (2)VDD33V I = 0 to VDD33±20μA
I OZPHigh-impedance, output current with internal pullup or pulldown resistor (4)VDD33V I = 0 to VDD33±250μA
I IInput current (5)VDD33V I = 0 to VDD33±15μA

Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

MINMAXUNIT
Supply Voltage RangeV DD Steady-state supply voltage-0.31.4V
Supply Voltage RangeV DD33 Steady-state supply voltage-0.33.8V
VoltageUSB_SSRXP_UP, USB_SSRXN_UP, USB_SSRXP_DN[4:1], USB_SSRXN_DP[4:1] and USB_VBUS terminals-0.31.4V
VoltageXI terminals-0.32.45V
VoltageAll other terminals-0.33.8V
Storage temperature, T stgStorage temperature, T stg-65150°C

Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

MINNOMMAXUNIT
VDD (1)1.1V supply voltage0.991.11.26V
VDD333.3V supply voltage33.33.6V
USB_VBUSVoltage at USB_VBUS PAD01.155V
T AOperating free-air temperature070°C
-4085°C
T JOperating junction temperature-40105°C

Thermal Information

THERMAL METRIC (1)TUSB8041 RGCUNIT
64 PINS
R θ JAJunction-to-ambient thermal resistance (2)26°C/W
R θ JCtopJunction-to-case (top) thermal resistance (3)11.5°C/W
R θ JBJunction-to-board thermal resistance (4)5.3°C/W
ψ JTJunction-to-top characterization parameter (5)0.2°C/W
ψ JBJunction-to-board characterization parameter (6)5.2°C/W
R θ JCbotJunction-to-case (bottom) thermal resistance (7)1.0°C/W
  • (3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
  • (4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8.
  • (5) The junction-to-top characterization parameter, ψ JT , estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining R θ JA , using a procedure described in JESD51-2a (sections 6 and 7).
  • (6) The junction-to-board characterization parameter, ψ JB , estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining R θ JA , using a procedure described in JESD51-2a (sections 6 and 7).
  • (7) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.

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Typical Application

The TUSB8041 is a four-port USB 3.0 compliant hub. It provides simultaneous SuperSpeed USB and highspeed/full-speed connections on the upstream port and provides SuperSpeed USB, high-speed, full-speed, or low speed connections on the downstream port. The TUSB8041 can be used in any application that needs additional USB compliant ports. For example, a specific notebook may only have two downstream USB ports. By using the TUSB8041, the notebook can increase the downstream port count to five.

Related Variants

The following components are covered by the same datasheet.

Part NumberManufacturerPackage
TUSB8041Texas InstrumentsVQFN-64 (RGC)
TUSB8041-Q1Texas Instruments
TUSB8041ITexas Instruments
TUSB8041IRGCRTexas Instruments
TUSB8041IRGCR.ATexas Instruments
TUSB8041IRGCTTexas Instruments
TUSB8041IRGCT.ATexas Instruments
TUSB8041RGCR.ATexas Instruments
TUSB8041RGCTTexas Instruments
TUSB8041RGCT.ATexas Instruments
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