TSL2591

Part: TSL2591, ams

Type: Light-to-digital converter

Key Specs:

• Dynamic Range: 600M:1
• Sleep State Current: 3.0 μA
• I2C Data Rate: up to 400 kbit/s
• Recommended Supply Voltage: 2.7 V to 3.6 V
• Recommended Operating Temperature: -30 °C (minimum)

Features:

• Dual Diode
• Programmable Analog Gain and Integration Time
• Two Internal Interrupt Sources
• Programmable Upper and Lower Thresholds
• One Interrupt Includes Programmable Persistence Filter
• User Selectable Sleep Mode
• I2C Fast Mode Compatible Interface
• Approximates Human Eye Response
• Flexible Operation
• Suited for Operation Behind Dark Glass

Applications:

• (No applications explicitly stated)

Package:

• ODFN-6
• FN Dual Flat No-Lead

The TSL2591 pin assignments are described below.

Figure TSL2591 – 3: Pin Diagram

Package FN Dual Flat No-Lead (Top View): Package drawing is not to scale.

Figure TSL2591 – 4: Pin Description

| Pin Number | Pin Name | Description | |------------|----------|----------------------------------------------------------|--| | 1 | SCL | 2C serial clock input terminal
I | | 2 | INT | Interrupt — open drain output (active low). | | 3 | GND | Power supply ground. All voltages are referenced to GND. | | 4 | NC | No connect — do not connect. | | 5 | VDD | Supply voltage | | 6 | SDA | 2C serial data I/O terminal
I |

All limits are guaranteed. The parameters with min and max values are guaranteed with production tests or SQC (Statistical Quality Control) methods.

Figure TSL2591 – 7: Recommended Operating Conditions

Symbol	Parameter	Min	Typ	Max	Units
VDD	Supply voltage	2.7	3	3.6	V
TA	Operating free-air temperature	-30		70	ºC

Figure TSL2591 – 8: Operating Characteristics, VDD=3V, TA=25ºC (unless otherwise noted)

Symbol	Parameter	Conditions	Min	Typ	Max	Units
I DD	Supply Current	Active Sleep state - no I2C activity		275 2.3	325 4	μA
VOL	INT, SDA output low voltage	3mA sink current 6mA sink current	0 0		0.4 0.6	V
I LEAK	Leakage current, SDA, SCL, INT pins		-5		5	μA
VIH	SCL, SDA input high voltage		0.7 VDD			V
VIL	SCL, SDA input low voltage				0.3 VDD	V

Figure TSL2591 – 9: ALS Characteristics, $V_{DD}$ =3V, $T_A$ =25°C, AGAIN = Max, AEN=1, (unless otherwise noted) (Notes 1, 2, 3),

Parameter	Conditions	Channel	Min	Typ	Max	Units
Dark ADC count value	E e = 0, ATIME=000b (100ms)	CH0 CH1	0 0		25 25	counts
ADC integration time step size	ATIME = 000b (100ms)		95	101	108	ms
ADC number of integration steps (Note 4)			1		6	steps
ADC counts per step	ATIME = 000b (100ms)		0		37888	counts
ADC count value	ATIME = 101b (600ms)		0		65535	counts
ADC assertantia	White light (Note 2) $E_e = 4.98 \mu \text{W/cm}^2$ ATIME = 000b (100 ms)	CH0 CH1	25500	30000 4996	34500	counts
ADC count value	$\lambda_p = 850 \text{ nm (Note 3)}$ $E_e = 5.62 \ \mu\text{W/cm}^2,$ ATIME = 000b (100 ms)	CH0 CH1	25500	30000 19522	34500	counts
ADC count value	White light (Note 2)		0.116	0.166	0.216
ratio: CH1/CH0	$\lambda_p = 850 \text{ nm (Note 3)}$		0.456	0.652	0.848
R e	White light (Note 2) ATIME = 000b (100 ms)	CH0 CH1		6024 1003		counts/
Irradiance responsivity	$\lambda_p = 850 \text{ nm (Note 3)}$ ATIME = 000b (100 ms)	CH0 CH1		5338 3474		(μW/cm 2 )
Noise (Note 4)	White light (Note 2) $E_e = 4.98 \mu \text{W/cm}^2$ ATIME = 000b (100 ms)	CH0		1	2	1 standard deviation
Gain scaling, relative to 1× gain setting	AGAIN = Low AGAIN = Med AGAIN = High AGAIN = Max			1 25 428 9876		×

• 1. Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible white LEDs and infrared 850 nm LEDs are used for final product testing for compatibility with high-volume production
• 2. The white LED irradiance is supplied by a white light-emitting diode with a nominal color temperature of 4000 K.
• 3. The 850 nm irradiance is supplied by a GaAs light-emitting diode with the following typical characteristics: peak wavelength $\lambda_p = 850$ nm and spectral halfwidth $\Delta\lambda 1/2 = 42$ nm.
• 4. Parameter ensured by design and is not 100% tested.

Timing Characteristics

The timing characteristics of TSL2591 are given below.

Figure TSL2591 – 10: AC Electrical Characteristics, VDD = 3 V, TA = 25ºC (unless otherwise noted)

Parameter†	Description	Min	Typ	Max	Units
f(SCL)	Clock frequency (I2C only)	0		400	kHz
t(BUF)	Bus free time between start and stop condition	1.3			μs
t(HDSTA)	Hold time after (repeated) start condition. After this period, the first clock is generated.	0.6			μs
t(SUSTA)	Repeated start condition setup time	0.6			μs
t(SUSTO)	Stop condition setup time	0.6			μs
t(HDDAT)	Data hold time	0			μs
t(SUDAT)	Data setup time	100			ns
t(LOW)	SCL clock low period	1.3			μs
t(HIGH)	SCL clock high period	0.6			μs
tF	Clock/data fall time			300	ns
tR	Clock/data rise time			300	ns
Ci	Input pin capacitance			10	pF

^† Specified by design and characterization; not production tested.

Timing Diagrams

Figure TSL2591 – 11: Parameter Measurement Information

Typical Operating Characteristics

Figure TSL2591 – 12: Spectral Responsivity

Spectral Responsivity: Two channel response allows for tunable illuminance (lux) calculation regardless of transmissivity of glass.

Figure TSL2591 – 13: White Normalized Responsivity vs. Angular Displacement

White LED Angular Response: Near cosine angular response for broadband white light sources.

Figure TSL2591 – 14: Normalized IDD vs. VDD and Temperature

IDD vs. VDD vs. Temp: Effect of supply voltage and temperature on active current.

Figure TSL2591 – 15: Response to White LED vs. Temperature

White LED Response v Temp: Effect of temperature on the device response for a broadband white light source.

Register Description

The device is controlled and monitored by registers accessed through the I2C serial interface. These registers provide for a variety of control functions and can be read to determine results of the ADC conversions. The register set is summarized in Figure TSL2591 - 16.

Figure TSL2591 – 16: Register Description

Address	Register Name	R/W	Register Function	Reset Value
	COMMAND	W	Specifies Register Address	0x00
0x00	ENABLE	R/W	Enables states and interrupts	0x00
0x01	CONFIG	R/W	ALS gain and integration time configuration	0x00
0x04	AILTL	R/W	ALS interrupt low threshold low byte	0x00
0x05	AILTH	R/W	ALS interrupt low threshold high byte	0x00
0x06	AIHTL	R/W	ALS interrupt high threshold low byte	0x00
0x07	AIHTH	R/W	ALS interrupt high threshold high byte	0x00
0x08	NPAILTL	R/W	No Persist ALS interrupt low threshold low byte	0x00
0x09	NPAILTH	R/W	No Persist ALS interrupt low threshold high byte	0x00
0x0A	NPAIHTL	R/W	No Persist ALS interrupt high threshold low byte	0x00
0x0B	NPAIHTH	R/W	No Persist ALS interrupt high threshold high byte	0x00
0x0C	PERSIST	R/W	Interrupt persistence filter	0x00
0x11	PID	R	Package ID
0x12	ID	R	Device ID	ID
0x13	STATUS	R	Device status	0x00
0x14	C0DATAL	R	CH0 ADC low data byte	0x00
0x15	C0DATAH	R	CH0 ADC high data byte	0x00
0x16	C1DATAL	R	CH1 ADC low data byte	0x00
0x17	C1DATAH	R	CH1 ADC high data byte	0x00

Note: JGS-Stopped here.

Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only. Functional operation of the device at these or any other conditions beyond those indicated under "Operating Conditions" is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Figure TSL2591 – 6: Absolute Maximum Ratings

Parameter	Min	Max	Units	Comments
Supply voltage, VDD		3.8	V	All voltages are with respect to GND
Input terminal voltage	-0.5	3.8	V
Output terminal voltage	-0.5	3.8	V
Output terminal current	-1	20	mA
Storage temperature range, Tstg	-40	85	ºC
ESD tolerance, human body model		2000	V