MC74HC00A

Part: MC74HC00A — onsemi

Type: Quad 2-Input NAND Gate (High-Performance Silicon-Gate CMOS)

Description: Quad 2-input NAND gate with a 2–6 V supply range, 10 LSTTL load drive capability and an LS00-compatible pinout.

Operating Conditions:

• Supply voltage: 2.0–6.0 V
• Operating temperature: -55 to +125 °C
• Input/output voltage: 0 to VCC
• Input rise/fall time: up to 1000 ns at VCC = 2.0 V (500 ns and 400 ns limits apply at the higher VCC values)

Absolute Maximum Ratings:

• Max supply voltage (VCC): -0.5 to +6.5 V
• DC input voltage: -0.5 to VCC + 0.5 V
• DC output current per pin: ±25 mA
• DC supply current (VCC and GND pins): ±50 mA
• Junction temperature under bias: +150 °C
• Storage temperature: -65 to +150 °C

Key Specs:

• VIH (min): 1.50 V at VCC = 2.0 V; 3.15 V at 4.5 V; 4.20 V at 6.0 V
• VIL (max): 0.50 V at VCC = 2.0 V; 1.35 V at 4.5 V; 1.80 V at 6.0 V
• VOL (max): 0.1 V at |Iout| ≤ 20 μA; 0.26 V at 4.5 V and |Iout| ≤ 4.0 mA (-55 to 25 °C)
• VOH (min): 3.98 V at VCC = 4.5 V, |Iout| ≤ 4.0 mA (-55 to 25 °C)
• Input leakage: ±0.1 μA (-55 to 25 °C), ±1.0 μA (≤125 °C), at VCC = 6.0 V
• Quiescent supply current: 1.0 μA (-55 to 25 °C), 10 μA (≤85 °C), 40 μA (≤125 °C), at VCC = 6.0 V
• Propagation delay tPLH/tPHL (max): 15 ns at 4.5 V, 25 °C; 22 ns at 4.5 V, ≤125 °C
• Input capacitance: 10 pF max; CPD 22 pF typical (VCC = 5.0 V, 25 °C)

Features:

• Outputs directly interface to CMOS, NMOS and TTL
• Output drive capability: 10 LSTTL loads
• High noise immunity characteristic of CMOS devices
• Low input current: 1 μA
• Complies with JEDEC Standard No. 7A requirements
• -Q suffix: AEC-Q100 qualified and PPAP capable
• Chip complexity: 32 FETs or 8 equivalent gates
• Pb-free, halogen free and RoHS compliant
• ESD: >2000 V HBM, >1000 V CDM

Applications:

• General-purpose digital logic
• Automotive and other applications requiring unique site and control change (-Q suffix)

Package:

• SOIC-14 NB
• TSSOP-14 (5.00 × 4.40 × 0.95 mm, 0.65 mm pitch)

• Outputs Directly Interface to CMOS, NMOS and TTL
• Output Drive Capability: 10 LSTTL Loads
• Operating Voltage Range: 2 to 6 V
• High Noise Immunity Characteristic of CMOS Devices
• Low Input Current: 1 m A
• In Compliance With the JEDEC Standard No. 7 A Requirements
• -Q Suffix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC-Q100 Qualified and PPAP Capable
• Chip Complexity: 32 FETs or 8 Equivalent Gates
• These Devices are Pb-Free, Halogen Free and are RoHS Compliant

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.

1. Measured with minimum pad spacing on an FR4 board, using 76 mm-by-114 mm, 2-ounce copper trace no air flow per JESD51-7.

2. HBM tested to EIA / JESD22-A114-A. CDM tested to JESD22-C101-A. JEDEC recommends that ESD qualification to EIA/JESD22-A115A (Machine Model) be discontinued.

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability.

1. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or V CC ). Unused outputs must be left open.