ZD25WQ16CEIGR

Part: ZD25WQ16B

Type: Serial Multi I/O Flash Memory

Description: An ultra-low power, 16M-bit serial multi I/O Flash memory with a wide supply range of 1.65V to 3.6V, supporting X1, X2, and X4 I/O modes, and offering high reliability with 100K cycling and 20-year data retention.

Operating Conditions:

• Supply voltage: 1.65V to 3.6V
• Operating temperature: -40°C to 85°C
• SPI Modes: Mode 0 and Mode 3

Absolute Maximum Ratings:

• Max supply voltage: 4.0V
• Max junction/storage temperature: 150°C

Key Specs:

• Memory density: 16M-bit
• Active Read current: 4mA at 33MHz
• Active Program or Erase current: 6mA
• Deep Power Down current: 0.1μA
• Standby current: 12μA
• Page program time: 1.3ms
• Sector erase time (4K-byte): 10ms
• Block erase time (32K/64K-byte): 10ms
• Chip erase time: 10ms
• Program/Erase Cycles: 100,000
• Data Retention: 20 years

Features:

• Single, Dual and Quad IO mode
• Flexible Architecture for Code and Data Storage (Page, Sector, Block, Chip Erase)
• One Time Programmable (OTP) Security Register (3*512-Byte)
• Software Protection Mode (Block Protect bits)
• 128-bit unique ID
• Program/Erase Suspend and Resume
• Hardware Protection Mode (WP Pin)

Applications:

• High-volume consumer based applications where program code is shadowed from Flash memory into RAM
• Data storage applications

Package:

• 8-pin SOP (150mil/208mil)
• 8-land USON (3x2x0.55mm)
• 8-land WSON (6x5mm)
• 8-pin TSSOP
• WLCSP
• KGD for SiP

• One Time Programmable (OTP) Security Register
• -3*512-Byte Security Registers With OTP Lock
• Software Protection Mode
• -TheBlockProtect(BP4,BP3,BP2,BP1,andBP0)bitsdefinethesectionofthememoryarraythatcanbe read but not change.
• 128 bit unique ID for each device
• Program/Erase Suspend and Program/Erase Resume
• JEDEC Standard Manufacturer and Device ID Read Methodology

NOTICE: Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.

Figure 4-1 Maximum Overshoot Waveform

Maxinum Negative Overshoot Waveform

Table 4-1 Pin Capacitance [1]

Maxinum Positive Overshoot Waveform

Note:

Test Conditions: TA = 25°C, F = 1MHz, Vcc = 3.0V.

Figure 4-2 Input Test Waveforms and Measurement Level

Note

:

Inputpulse rise and fall time eara < 5ns

Figure 4-3 Output Loading

Figure 4-3 Output Loading