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MCIMX7D2DVM12SD

The MCIMX7D2DVM12SD is an electronic component from NXP USA Inc.. View the full MCIMX7D2DVM12SD datasheet below including key specifications, electrical characteristics.

Manufacturer

NXP USA Inc.

Category

Integrated Circuits (ICs)

Package

541-LFBGA

Lifecycle

Active

Key Specifications

ParameterValue
Additional InterfacesAC'97, CAN, eCSPI, I2C, I2S, MMC/SD/SDIO, PCIe, QSPI, SAI, UART
Case/PackageLFBGA
China RoHSCompliant
Co-Processors/DSPMultimedia; NEON™ MPE
Core ProcessorARM® Cortex®-A7, ARM® Cortex®-M4
Display & Interface ControllersKeypad, LCD, MIPI
Ethernet10/100/1000Mbps (2)
Graphics AccelerationNo
Height - Seated (Max)1.42 mm
Introduction Date2017-07-25
Length19 mm
Lifecycle StatusProduction (Last Updated: 2 months ago)
Max Operating Temperature85 °C
Max Supply Voltage1.25 V
Min Operating Temperature0 °C
Min Supply Voltage1.2 V
Mounting TypeSurface Mount
Nominal Supply Voltage (DC)1.225 V
Number of Cores/Bus Width2 Core, 32-Bit
Number of Pins541
Number of Terminals541
Operating Temperature0°C ~ 85°C (TJ)
Package / Case541-LFBGA
PackagingTray
RAM ControllersLPDDR2, LPDDR3, DDR3, DDR3L
REACH SVHCYes
RoHSCompliant
Security FeaturesA-HAB, ARM TZ, CAAM, CSU, SJC, SNVS
Clock Speed1.2GHz
Standard Pack Qty84
Supplier Device Package541-MAPBGA (19x19)
Terminal Pitch750 µm
USBUSB 2.0 + PHY (1), USB 2.0 OTG + PHY (2)
Voltage - I/O1.8V, 3.3V
Width19 mm

Overview

IC MPU I.MX7D 1.2GHZ 541MAPBGA

Features

The i.MX 7Dual family of processors is based on Arm Cortex-A7 MPCore™ Platform, which has the following features:

  • Two Arm Cortex-A7 Cores (with TrustZone ® technology)

  • The core configuration is symmetric, where each core includes:

  • 32 KByte L1 Instruction Cache

  • 32 KByte L1 Data Cache

  • Private Timer and Watchdog

  • NEON MPE (media processing engine) coprocessor

Electrical Characteristics

This section provides the device and module -level electrical characteristics for the i.MX 7Dual family of processors.

Thermal Information

Table 8 displays the thermal resistance data.

Per JEDEC JESD51-2, the intent of thermal resistance measurements is solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and does not predict the performance of a package in an application-specific environment.

Table 8. Thermal Resistance Data

RatingTest conditionsSymbol12x12 pkg value19x19 pkg valueUnit
Junction to Ambient 1Single-layer board (1s); natural convection 2 Four-layer board (2s2p); natural convection 2R JA R JA55.4 32.644.4 30.2o C/W o C/W
Junction to Ambient 1Single-layer board (1s); airflow 200 ft/min 2,3 Four-layer board (2s2p); airflow 200 ft/min 2,3R JA R JA41.8 28.034.3 25.8o C/W o C/W
Junction to Board 1,4-R ← JB16.017.4o C/W
Junction to Case 1,5-R ← JC10.510.4o C/W
Junction to Package Top 1,6Natural ConvectionJT0.20.2o C/W
Junction to Package BottomNatural ConvectionR B_CSB15.317.3o C/W

5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1).

  • 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.

Package Information

Plastic Package

BGA 12 x 12 mm, 0.4 mm pitch BGA 19 x 19 mm, 0.75 mm pitch

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