ENC28J60-I/SP

Part: ENC28J60 — Microchip Type: Stand-Alone Ethernet Controller Description: IEEE 802.3 compatible Ethernet controller with integrated MAC and 10Base-T PHY, 8-Kbyte dual-port SRAM buffer, and SPI interface up to 20 MHz.

Operating Conditions:

• Supply voltage: 3.1V to 3.6V (3.3V typical)
• Operating temperature: -40°C to +85°C (Industrial), 0°C to +70°C (Commercial, SSOP only)
• Clock input: 25 MHz
• SPI clock speed: up to 20 MHz

Absolute Maximum Ratings:

Key Specs:

• Ethernet compatibility: IEEE 802.3™ (10/100/1000Base-T networks)
• Integrated components: MAC and 10Base-T PHY
• Buffer RAM: 8-Kbyte Transmit/Receive Packet Dual Port SRAM
• SPI interface clock speed: up to 20 MHz
• Clock output prescaler: Divide by 1, 2, 3, 4, or 8 (25 MHz down to 3.125 MHz)
• Oscillator start-up time: 7500 OSC1 clock cycles (300 μs)
• Input tolerance: 5V tolerant inputs (SI, SCK, CS, RESET pins)
• RBIAS resistor: 2.32 kΩ, 1% to ground

Features:

• Automatic polarity detection and correction for 10Base-T
• Full and Half-Duplex modes
• Programmable automatic retransmit on collision, padding, and CRC generation
• Programmable automatic rejection of erroneous packets
• Hardware managed circular receive FIFO
• Internal DMA for fast data movement
• Hardware assisted checksum calculation
• Programmable receive packet filtering and Wake-up Host on various criteria
• Loopback mode
• Two programmable LED outputs for status indication
• Six interrupt sources and one interrupt output pin
• Clock Out pin with programmable prescaler
• On-chip voltage regulator for 2.5V digital logic

Applications:

• Ethernet network interface for any controller equipped with SPI

Package:

• 28-Pin SPDIP
• SSOP
• SOIC
• QFN

• IEEE 802.3™ Compatible Ethernet Controller
• Fully Compatible with 10/100/1000Base-T Networks
• Integrated MAC and 10Base-T PHY
• Supports One 10Base-T Port with Automatic Polarity Detection and Correction
• Supports Full and Half-Duplex modes
• Programmable Automatic Retransmit on Collision
• Programmable Padding and CRC Generation
• Programmable Automatic Rejection of Erroneous Packets
• SPI Interface with Clock Speeds up to 20 MHz

Note 1: Negative current is defined as current sourced by the pin.

.

• Ambient temperature under bias.............................................................................................-40°C to +85°C (Industrial) 0°C to +70°C (Commercial)
• Voltage on VDD, VDDOSC, VDDPLL , VDDRX and VDDTX, with respect to VSS ................................................. -0.3V to 3.6V
• Voltage on RESET, CS, SCK and SI, with respect to VSS ........................................................................... -0.3V to 6.0V
• Voltage on CLKOUT, SO, OSC1, OSC2, LEDA and LEDB, with respect to VSS ...............................-0.3V to VDD + 0.3V
• Voltage on TPIN+/- and TPOUT+/- with respect to VSS ............................................................................... -0.3V to 5.0V
• VCAP with respect to VSS (Note 1) ............................................................................................................. -0.3V to 2.75V
• ESD protection on all pins..........................................................................................................................................2 kV
• Current sourced or sunk by LEDA, LEDB...............................................................................................................12 mA
• Current sourced or sunk by CLKOUT.......................................................................................................................8 mA
• Current sourced or sunk by INT and SO...................................................................................................................4 mA

Note 1: VCAP is not designed to supply an external load. No external voltage should be applied to this pin.

† Notice: Stresses above those listed under 'Maximum Ratings' may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.

.